Jandel manufactures the highest quality four-point probe heads available anywhere in the world and has models for all known types of four-point probing systems. These premium quality, jewel bearing four-point probe heads have been sold to the OEM equipment market since 1967 and are standard equipment on most brands of auto-stepping resistivity measurement equipment. BRIDGE Technology offers the Jandel line of four-point probes directly from Jandel to end users at significant savings when compared to the prices that OEM's typically charge.

Features include:

• Upper and lower jeweled guides
• Solid tungsten carbide needles for superior durability (osmium alloy available)
• Video inspection system and interferometer used to verify tip radii, spacing and planerity to 1% mechanical accuracy
• Tip spring loads are checked by electronic force gauge to 1% accuracy
• Three basic shapes will fit all mountings and systems
• Anodized aluminum alloy construction with internal Teflon insulation for low leakage
• A High/Low Temperature version is available
• A Vacuum Chamber version is available
• A Hall Measurement version is available
• A Hand-Held, Hand Applied Four Point Probe is available
  
  
  

Probe Head Application Chart
Click on probe head style or probe image below for additional information

Six Way Probe for use with:	Prometrix, KLA/Tencor, CDE
Cylindrical Probe for use with:	Jandel Multiposition Wafer Probe, Jandel Hand Applied Probe, Jandel Multi Height Probe, Jandel Micro Position Probe, certain OEM wafer mapping systems, and various engineering applications
Four Pin Probe for use with:	Napson
Cartridge with Lead for use with:	ASM, PIE, Veeco AP150 (w/fell adaptor), Veeco FPP5000 (upside down-also w/fell adaptor), Parc-Amber, Probex, and for various engineering applications
Compact Probe for use with:	Veeco FPP5000 (upside down-in Alessi adaptor), Veeco FPP100 (old model with force balance - also in Alessi adaptor), GRQ Instruments equipment
Miniature Cartridge for use with:	Kokusai and early Napson
Miniature Cartridge with 6-32 tapped holes for use with:	Signatone, Magne-tron, Chang Min Tech
Macor Probe Head for use in:	Various high/low temperature/engineering Applications.Probe
Hall Effect Probe Head	Jandel Square Array Probe for use in making Hall Effect measurements.

4 Point Probe Head Specifications

PROBE SPACING	25-50 mils by 5 mil increments: 1.00 mm 1/2(pi) cm (1.591 mm or about 62.6 mils)
TOLERANCE	+/-0.01 mm
ARRANGEMENT	Linear or Square array
NEEDLES	Solid Tungsten carbide Ø 0.40 mm (Ø 0.30 mm for close-spacing) 45 degree included angle, phosphor-bronze connecting ligament
OTHER MATERIALS	50% osmium alloy tips available
RADII	12.5 µm min. to 500 µm max. polished with 2 µm diamond
RETRACTION TO INSULATING PAD	0.5 mm
PLANARITY	+/- 0.025 mm or better
LOADS:
CARTRIDGE (Preset)	10g min. to 250g max. per needle. Not user adjustable
CYLINDRICAL AND COMPACT (adjustable)	Low: 10-30g, Medium: 30-60g High: 60-150g
LEADS	4-way cable Teflon insulated (screened on cylindrical)
ELECTRICAL LEAKAGE	1013 ohms resistance between needles at 100 volts