![]() The Multi Height Microposition Probe has a removeable X-Y stage which provides the sample size versatility of the Multi Height Probe and the high tip placement accuracy of the Microposition Probe. Four screws can be removed to take off the X-Y sample stage, essentially turning the Multi Height Microposition Probe into a Multi Height Probe. The X-Y stage is the same type as is used on the Microposition Probe. Application Ideal for probing a broad range of materials from small samples where high placement accuracy is required up to large materials, wafers, and ingots up to 10" in diameter and 6" in height. An optional probe head shroud shields light from any sample up to 2" diameter. Click here to download a document regarding the light shroud (the "Large Shroud") available for the Jandel Multi Height Microposition Probe for use in blocking light from sample up to 2" in diameter [150K PDF file] |
A complete four point probing system consists of the Multi Height Microposition Probe shown above, combined with the RM3 Test Unit |
BRIDGE Technology is an authorized representative of JANDEL Engineering Ltd.
To request further information please call Bridge Technology at (480) 219-9007 / Fax (480) 452-0172, or send e-mail to Larry Bridge at: sales@bridgetec.com
For sales outside of North America, please contact Jandel directly at info@jandel.co.uk
Jandel has a Web Site at: http://www.jandel.co.uk/
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