• Allows probing of wafers, ingots, or samples of widely varying dimensions
• Locking mechanism allows the arm to be moved up and down the steel pole and locked to suit any sample height
• Plug attached to the arm prevents the wiring from getting entangled with samples, fingers etc
• Smooth base for positioning samples
• Includes one Jandel Cylindrical probe head

Measurement of resistivity of samples by the four point technique. From wafers to ingots up to 10" deep by 6" high. Width is limited only by need to support the ends.

There is no provision for obscuring light from the specimens.

The unit comprises a hard anodised aluminium alloy plate 8mm thick with a vertical column, on which is mounted a Jandel cylindrical probe with a raising and lowering mechanism. You can slide this assembly up or down the column and clamp it in position. If desired an adjustable micro-switch enables an interlock to operate prevent sparking when the probe is lowered onto the specimen.

The connection to a measuring system is made via a 9-way socket on the raising and lowering assembly. The probe head can be changed by releasing a single clamp screw and unplugging from a 5-way socket. The probe head / lead is identical to that used on the Jandel Multiposition probe.