Manual and Semiautomatic Probe Stations for Failure Analysis Signatone has been supplying semiconductor failure analysis probing equipment since the earliest days of the industry. Each of the probing systems shown below can be configured specially for failure analysis. Several accessories that are commonly used in device failure analysis are can be see by clicking on one of the links at the bottom of the page.
CheckMate Series Probe Stations			Checkmate probe stations are available in five 200mm/300mm versions: 1) The CM100 is a fully manual system. 2) The CM200 is a joystick controlled system. 3) The CM300 is a joystick controlled system with a remote encoded dial controller. 4) The CM400 includes the Signatone Solutions Windows software and has a programmable microscope stage. 5) The CM500 includes the Signatone Solutions Wafer Mapping Windows software and has programmable wafer stage and microscope stage movements. CheckMate probe stations are available with the Signatone Local Chamber option which provides protection from Light and RF during low current analysis, and Condensation during cold probing applications. Signatone's TRIPAK Low Current Analysis hardware allows the CheckMate Probe Stations to be used to measuring fA currents @ temperatures up to 300C. A wide range of Probing Accessories including thermal chucks, lasers, dark boxes, programmable micropositioners and vibration isolation solutions are available. Each CheckMate station, including the CM100, is pre-wired so that upgrades to a higher level of motorization or automation can be accomplished in the field without removing the probe station from the customer's facility.
S--460 Semiautomatic Probe Station			The S-460 probe stations will accommodate wafers up to 6" in diameter and can be used for a wide range of applications including failure analysis, design-debug, product engineering, and even low volume production testing. The Signatone Solutions Windows software provides user friendly wafer mapping and can interface to several instrument control software packages to provide a truly automated test system. Thermal chucks are available in a variety of temperature ranges. Software/hardware features include programmable soft Z motion, two point theta alignment, on-screen video, and over 100 user commands. The system will support programmable micropositioners, and is available with a joystick/thumbwheel controller. The S-460 is a versatile feature packed system for wafers up to 6".
S-1160 Probe Station			The Signatone S-1160 is a rugged, economically priced, manual probe station that can be fitted with either high powered optics for probing small geometries or lower powered optics for probing bonding pads and larger geometries. The S-1160 is available in a variety of configurations for applications including RF probing, low current (femtoamp range) probing, failure analysis, thermal probing and other uses. The S-1160 will accept both magnetic base and vacuum base micropositioners and is equipped with vacuum ports for up to twelve vacuum base micropositioners. The S-1160 has a proven track record for reliability and functionality at an attractive price.
TH76 Test Head Probe Station			The TH76 Test Head Prober is constructed around a vibration isolation table. The test head is "docked" beneath a large plate (the vibration table top) that floats on a cushion of compressed N2 or C.D.A. A hole is milled into the plate to provide for probing into the device. A micropositioner support platen is mounted on top of the plate. The system has wheels so that it can be positioned above the test head. An assortment of options are available to enhance the probing capabilities of the system, including CAP (Computer Aided Probing) options, lasers, manual or motorized micropositioners, active probes, etc.
Board Mount Chuck Mount small PC boards onto probe stations	Stable Temp Fluid Hot Chuck System For Hot Spot Detection	Diagnostic Laser Cutting Systems Prober mountable laser systems	-65oC to +200oC Hot Chuck Systems	Vibration Isolation Tables To remove annoying vibrations

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