Signatone H-100 Series Probe Station
H-100 series probe stations include a three inch square device / substrate
chuck and are primarily designed for probing thick film devices such as
ceramic substrates, printed circuit boards and hybrid circuits. The H-150
system, however, can be equipped with a four inch diameter wafer chuck
for probing wafers up to four inches in diameter. H-100 series probe stations
are available in three versions: H-100, H-120 and H-150. The modular design
provides a wide number of options to suit a broad range of needs. All models
include an aluminum base casting, a device stage with four inches of X-Y
travel, a linear motion platen that can be raised and lowered using either
a crank or a lever, and a microscope tower for mounting Stereozoom optics
in a fixed position. A 4" x 4" microscope stage is optional.
The platen will accept up to six magnetic based micropositioners and a
probe card adapter for use with probe cards. Micropositioner electrical
connections are made through six pin jacks that correspond to color coded
banana plugs.
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